LORENTZ-HF™, the high frequency version of LORENTZ™, is an easy-to-use 3D full-wave electromagnetic simulator based on CFIE (combined-field integral equation) combined with the ability to analyze charged particle trajectories in the presence of high frequency electromagnetic fields.

It uses the Method of Moments (MoM) for solving the high frequency electromagnetic fields, coupled with the ray tracing and powerful emission regime and secondary emission capabilities of LORENTZ™.

LORENTZ-HF™ also calculates near and far field results, power and directive gain, radar cross-section, axial ratio, and input impedance, admittance and scattering parameters.

It is uniquely suited for early-stage simulation and resolution of the Multipactor Discharge phenomenon affecting many high-power vacuum electronics device designs.

LORENTZ-HF™ can also be combined with electrostatics, magnetostatics and time-domain solvers for LORENTZ-HFE™, LORENTZ-HFM™ and LORENTZ-HFTD™.

LORENTZ-LF™, the low frequency version of LORENTZ™ can be combined in a similar way for LORENTZ-LFE™ and LORENTZ-LFM™.


  • Full secondary emission is available with a probabilistic chance of emission depending on primary impact energies.
  • Particle interaction with gravity, viscosity, and mobility, scattering through residual gas collisions.
  • Sources include: Incident plane wave, delta voltage, line voltage, waveguide, and magnetic frill.
  • A wide range of graphs & plots (near field, far field, rectangular, Smith Charts, radiation patterns) can be created based on parameters such as H, B, E, D, J, Z, S, Y.
  • Display rectangular plots of current, fields and input impedance. Display polar plots of power gain, contours of currents and fields. Display 3D surface plots of radiation patterns and display Smith charts of s-parameters.
  • Export results to text files.
  • Powerful parametric section enables user-defined changes to model geometries, materials, boundary and voltage conditions etc.
  • Includes SINGULA™'s MoM, FEM, and Physical Optics capabilities for simulating radiation, scattering and other high-frequency applications.
  • LORENTZ-HF™ can also be hybridized with INTEGRATED low frequency electric or magnetic solvers to include effects such as:
    • Various emission regimes, including: Fowler-Nordheim, Child’s Law, Richardson-Dushman, Schottky and Extended Schottky.
    • Simulate lens focusing properties, beam emittance and space charge.

LORENTZ™ has very friendly user interface and the flexibility to develop CAD-like models”

“The best feature of LORENTZ™ is the combination of field calculation and trajectories calculation with high accuracy. It is quite convenient to check the field setting and to obtain the trajectories immediately. The calculation precision is satisfying if you make the right setting.”

“Comparison of our real hardware measured data with LORENTZ™™ has correlated extremely well and helped us save significant time and money.”

LORENTZ™‘s ability to import any computational domain or structure from CAD makes it extremely useful.”

LORENTZ™ has many intuitive features and one of them is to successfully analyze trajectory transient conditions. As far as customer service and technical support is concerned, the staff at Integrated Engineering Software is quick to respond to issues and provide solutions to any software problems.”

“I have been using LORENTZ™ a long time now. I am very pleased with the BEM solver and trajectory analysis feature of LORENTZ™ software. The ability to solve in multiple current emission regimes is the most unique feature to allow us to create powerful solutions.”

LORENTZ™ is an indispensable tool for electric and magnetic field calculations. To the best of our knowledge, no other software includes the BEM solver with CAD import capability which is extremely important for our application.”

“I have been playing around with the API this weekend. It’s a very powerful and a super useful feature! Good work guys! So far I have been using Excel to interface with LORENTZ™ and it works like a charm with both 2EM & 3EM.”